Workshop on High-Resolution Depth Profiling

The Tandem Laboratory hosted the 9th International Workshop on High-Resolution Depth Profiling (HRDP-9) at Uppsala University, Sweden, in June 2018.

Download the Book of Abstracts

 Topics included

  • Ion Detection in Helium Ion Microscopy and Atom Probe Tomography
  • Low and Medium Energy Ion Scattering
  • Material Science Analysis Using HRDP Methods
  • New Facilities and Instrumental Developments
  • Quantitative Analysis of Biological Surfaces and Interfaces
  • Rutherford Backscattering, Elastic Recoil Detection and Narrow Nuclear Reaction Profiling with Atomic Layer Depth Resolution
  • Secondary Ion Mass Spectroscopy and Alternative Depth Profiling Methods
  • Special Topics (RRT, etc.)
  • Theoretical Developments and New Computer Simulations

List of speakers

  • Gunther Andersson – Flinders University, Australia: High Resolution Concentration Depth Profiles for Analysing Soft Matter Surfaces with NICISS
  • Philip Batson – Rutgers University, USA: Phonon Spectroscopy and Mapping in Nanostructures
  • Alfredo Correa – Lawrence Livermore National Laboratory, USA: From low-energy electronic stopping power to molecular dynamics with electron-phonon coupling
  • Paul Dastoor – University of Newcastle, Australia: Scanning Helium Atom Microscopy: Imaging with a Deft Touch
  • Sarah Fearn – Imperial College London, Great Britain: Applications of high resolution LEIS and ToF-SIMS for challenges in materials science
  • Lyudmila Goncharova – University of Western Ontario, London, Canada: Transmission and reflection channeling in Si membranes: HIM and MEIS study
  • Pedro L. Grande – UFRGS, Porto Alegre, Brazil: New developments on the energy loss of slow and high energy ions in an electron gas system.
  • Torgny Gustafsson – Rutgers University, USA: Nano-Scale Ion Beam Imaging, Modification and Analysis
  • Marcus Hans – RWTH Aachen, Germany: Local chemical composition of hard coatings at the nanometer scale revealed by atom probe tomography
  • René Heller – HZDR Dresden, Germany: Automated Target Model Determination from MEIS Spectra Utilizing an Evolutionary Algorithm
  • Nico Klingner – HZDR Dresden, Germany: High Resolution in 3 dimensions - TOF-SIMS in the HIM
  • DaeWon Moon – DGIST, Korea: Surface and interface analysis of liquids and wet specimen with ion beam techniques
  • Kaoru Nakajima – Kyoto University, Japan: Imaging of organic materials by transmission SIMS using MeV primary ions
  • Thomas Osipowicz – National University of Singapore Development of High Resolution ERDA at CIBA, NUS
  • Daichiro Sekiba – The University of Tsukuba, Japan: High sensitivity HERDA and ambient NRA for hydrogen observation
  • Maarten Vos – The Australian National University, Australia: Surface composition and electronic structure measured by high-energy electron scattering